Skip to product information
ECS-Y Compact Thermal Atomic Layer Deposition (ALD) Machine (Sample: Max. 8"), EYCTALDM

ECS-Y Compact Thermal Atomic Layer Deposition (ALD) Machine (Sample: Max. 8"), EYCTALDM

In Stock SKU: EYCTALDM
Use your own shipping account?

We support FedEx, UPS, and DHL third-party billing for institutional customers.

Place your order first, then email shipping@echemsupplies.com with your account details and order number. We'll generate the label using your account and refund your shipping charges, less a handling fee.

Review third-party shipping terms →


A thermal atomic layer deposition (ALD) machine is a precise thin-film coating system that deposits materials one atomic layer at a time using alternating, self-limiting chemical reactions at elevated temperatures (150-350 degrees). It ensures high conformality and atomic-scale thickness control, ideal for high-aspect-ratio 3D structures and, typically, for creating oxides, nitrides, and other thin films

The key components and features are: (1) Reaction Chamber: Heated, high-vacuum chamber where the substrate (up to 6–8 inches, typically) is held. (2) Precursor Delivery System: Multiple heated gas lines with MFCs (Mass Flow Controllers) allow for introducing alternating precursors (e.g., metal-organic precursors and H2O, or O3). (3) Pulse/Purge Valves: High-speed, high-temperature valves, such as those found on the Veeco Savannah, control the precise, alternating dosage and inert gas purge cycles.

The mini benchtop thermal ALD has following unique features: (1) Throughput: These systems are "one-at-a-time." Coating a full roll of foil for a pilot line would require a Spatial ALD or Roll-to-Roll system, which are much larger than benchtop units. (2) Precursor Costs: While the amount used is tiny, specialized precursors (like those for solid-state electrolyte coatings) can be expensive. (3) Cycle Time: ALD is a slow process. Deposition of a 5-10 nm layer can take 1 to 2 hours depending on the cycle purge times.

The general working mechanism of the thermal ALD process are shown below:

Part Number
  • EYCTALDM (EY-CTALDM)
Power
  • AC380V±10%, three-phases, 50/60Hz, 15 kW
ALD Machine Features
  • Max. Sample: 8" wafer (200mm*200mm)
  • Heating Temperature for Sample Stage: RT-500 ℃
  • Precursor: 3*50 mL precursor bubblers and one reaction channel are included. The heating temperature is RT-200 ℃. 
  • It can be upgraded to six precursors and two reaction channels upon request.
  • Four fast-response ALD valves with heating temperature of RT-200℃. 
  • MFC: Max. 200 sccm
  • Vacuum gauge: dual-grade, 0.0005 Torr -1000 Torr.
  • Vacuum Pump can support <5x10-3 Torr vacuum level
  • The ALD parameters can be edited in the individual touch screen and the data can be recorded in real time. 
  • The alarm and safety lock are available for monitoring the temperature, pressure, and flow. 
  • The deposition uniformity is >98% (take SnO2 as an example)

         

Optional Module for Add-On (not included)
  • The QCM unit can be added to monitor the growth rate and thickness in real time. Accuracy is 0.1 Å. The maximum measuring temperature is 200 ℃
  • O3 generator with O2 flow meter can be supplied to replace the conventional H2O oxidant source. 
  • The plasma module can be upgraded to realize PEALD upon request. 
Certification
  • CE certified
  • UL and CSA certification is available upon request at extra cost
Dimension
  • L1150 * W680 * H1050 mm
Weight
  • ~400 kg

References:

A. Cappella, et al., High Temperature Thermal Conductivity of Amorphous Al2O3 Thin Films Grown by Low Temperature ALD, Adv. Engineering Mater., 2013, 15, 1046-1050

S. E. Potts, et al., Room-Temperature ALD of Metal Oxide Thin Films by Energy-Enhanced ALD, Chemical Vapor Deposition, 2013, 19, 125-133

You may also like