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ECS-JG Handheld Four-Probe Resistivity Tester for Electrical Conductivity Measurement of Thin Films, EJGHFPRS

ECS-JG Handheld Four-Probe Resistivity Tester for Electrical Conductivity Measurement of Thin Films, EJGHFPRS

$1,499.00 USD
In Stock SKU: EJGHFPRS2258B
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A Hand-Held Four-Probe Resistivity Tester (or portable sheet resistance meter) is a rapid, non-destructive quality control tool used to measure the electronic conductivity, bulk resistivity, and sheet resistance (Rs) of thin films, conductive coatings, and semiconductor wafers. Unlike benchtop test stands that require fixed mounting stages, handheld testers integrate a compact probe head, current source, voltmeter, and digital display into a portable unit for quick measurements across large substrates, production lines, or field samples.

The main applications can be: (1) Gas Diffusion Layers (GDLs) & PTLs: Fast quality screening of sheet resistance uniformity across large carbon paper, carbon cloth, or titanium felt sheets used in fuel cells and electrolyzers. (2) Transparent Conductive Films (TCOs): Testing ITO (Indium Tin Oxide), FTO, or aluminum-doped zinc oxide (AZO) coatings on glass/PET for solar cells, displays, and smart windows. (3) Battery Electrode Coatings: Measuring the electronic conductivity of dried slurry coatings (e.g., LFP, NMC, or Graphite) on current collectors to ensure proper carbon black percolation networks. (4) Thin Metal Evaporations: Checking the thickness and conductivity of sputtered Gold, Platinum, Copper, or Titanium seed layers (10 nm - 5 um).

Part Number
  • EJGHFPRS (E-JG-HFPRS) 
Power
  • AC110-220V±10% (DC24V adpator), 50/60Hz, 1W
Testing Resistivity Range/Resolution
  • Resistance: 0.01Ω-50 kΩ; Resolution: 0.001 Ω-10 Ω
  • Resistivity: 0.01Ω*cm-20 kΩ*cm; Resolution: 0.001 Ω*m-10 Ω*cm 
  • Square Resistance: 0.05 Ω/□ -100 kΩ/□; Resolution: 0.001 Ω/□ -10 Ω/□
  • Four testing ranges (Ω*cm): (1) ≤ 2 Ω, (2) 20 Ω, (3) 200 Ω, (4) 2000 Ω
  • Digital Voltage Reading: 20 mV, ±0.2%FSB, resolution of 1 uV
  • Digital Current Reading: 1 uA-10 mA, increment of 1 uA, ±0.2%FSB
Accommodating Sample Sizes 
  • Round testing platform (SZT-A): Φ15-130 mm
  • Square testing platform (SZT-C): 180mm * 180 mm
  • Length (height): H≤100 mm

Application Scenarios & Probe Types
  • Square Resistance Test of nano-coating (ST2258B-F01 Probe)

         

  • Square Resistance Test of ITO film (ST2258B-F01 Probe)

           

  • Square Resistance and Resistivity Test of Si wafer (ST2253-F01 Probe, Tungsten)

         

  • Resistivity Test of Carbon Coating (ST2558B-F02 Probe)

           

  • Resistivity Test of Battery Electrode (ST2558B-F02 Probe)

         

Dimension
  • L 210 * W 105 * H35 mm
Weight
  • ~0.5 kg


References

L. Frey, et al., Oriented Thiophene-Extended Benzotrithiophene Covalent Organic Framework Thin Films: Directional Electrical Conductivity, Adv. Funct., Mater., 2022, 32, 2205949. 

Magatte N. Gueye, et al., Structure and Dopant Engineering in PEDOT Thin Films: Practical Tools for a Dramatic Conductivity Enhancement, Chem. Mater. (2016) 28 (10): 3462–3468.


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